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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10801971 B1

PDFFull Text
Date of Patent:
Oct. 13, 2020

Filed:

Apr. 20, 2018

X-ray phase contrast imaging with fourier transform determination of grating displacement

Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Naoki Morimoto, Kyoto, JP;

Taro Shirai, Kyoto, JP;

Takahiro Doki, Kyoto, JP;

Satoshi Sano, Kyoto, JP;

Akira Horiba, Kyoto, JP;

Assignee:

Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;

Attorney:

Muir Patent Law, PLLC

Primary Examiner:

Anastasia Midkiff

Int. Cl.
CPC ...
G01N 23/041 (2018.01); A61B 6/00 (2006.01); G01N 23/20 (2018.01); G01N 23/20008 (2018.01); G06K 9/32 (2006.01); G21K 1/06 (2006.01); G06K 9/20 (2006.01); G01N 21/41 (2006.01); G01T 1/29 (2006.01); G06T 7/262 (2017.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); A61B 6/4035 (2013.01); A61B 6/484 (2013.01); G01N 23/20008 (2013.01); G01N 23/20075 (2013.01); G06K 9/2036 (2013.01); G06K 9/3208 (2013.01); G21K 1/06 (2013.01); A61B 6/5211 (2013.01); A61B 6/547 (2013.01); A61B 6/584 (2013.01); G01N 2021/4186 (2013.01); G01N 2223/064 (2013.01); G01N 2223/302 (2013.01); G01N 2223/313 (2013.01); G01N 2223/32 (2013.01); G01T 1/2914 (2013.01); G06K 2009/2045 (2013.01); G06T 7/262 (2017.01); G06T 2207/20056 (2013.01); G21K 2207/005 (2013.01);
Abstract

An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.

Find Patent Forward Citations

Morimoto, Naoki. (2020). X-ray phase contrast imaging with fourier transform determination of grating displacement (U.S. Patent No. 10801971). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10801971

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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