The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Jan. 31, 2018
Applicant:
Industry-university Cooperation Foundation Hanyang University, Seoul, KR;
Inventors:
Young Pil Kim, Seoul, KR;
Myung Chan Gye, Gyeonggi-do, KR;
Eunsong Lee, Gyeonggi-do, KR;
Gae Baik Kim, Seoul, KR;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/31 (2006.01); G01N 33/53 (2006.01); G01N 33/58 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/643 (2013.01); G01N 21/31 (2013.01); G01N 21/6428 (2013.01); G01N 21/6486 (2013.01); G01N 33/5308 (2013.01); G01N 33/582 (2013.01); G01N 33/587 (2013.01); G01N 21/6452 (2013.01); G01N 2021/174 (2013.01); G01N 2021/6432 (2013.01); G01N 2021/6491 (2013.01);
Abstract
Provided herein is a method of effectively quantifying a target material by performing both colorimetry and fluorescence analysis on the same sample, based on metal nanoparticles and an aptamer.