The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Mar. 29, 2018
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventors:

Toshimitsu Noguchi, Tokyo, JP;

Takuya Kambayashi, Tokyo, JP;

Shinichi Taniguchi, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 21/27 (2013.01); G01N 21/85 (2013.01); G01N 2021/8557 (2013.01); G01N 2021/8578 (2013.01);
Abstract

To perform more accurate analysis of a composition of a substance given at a sampling time, provided is an optical analysis apparatus, including: a flow passage, which is connected to a vessel, and is configured to allow a first substance to flow therethrough; an introduction unit, which is provided to the flow passage, and is configured to introduce at least two second substances to the flow passage, to thereby divide the first substance flowing through the flow passage; and a measurement unit, which is provided to the flow passage, and is configured to perform measurement by irradiating the first substance and the second substance flowing through the flow passage with light.


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