The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Nov. 15, 2017
Applicant:

Dalian University of Technology, Dalian, Liaoning Province, CN;

Inventors:

Zhenyu Zhang, Dalian, CN;

Junfeng Cui, Dalian, CN;

Leilei Chen, Dalian, CN;

Dongming Guo, Dalian, CN;

Assignee:

DALIAN UNIVERSITY OF TECHNOLOGY, Dalian, Liaoning, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); C01B 32/956 (2017.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); C01B 32/956 (2017.08); C01P 2004/04 (2013.01); C01P 2004/16 (2013.01); G01N 2203/0001 (2013.01); G01N 2203/005 (2013.01); G01N 2203/0016 (2013.01); G01N 2203/0067 (2013.01); G01N 2203/028 (2013.01); G01N 2203/0286 (2013.01);
Abstract

The present invention provides a self-healing method for fractured SiC amorphous nanowires. A goat hair in a Chinese brush pen of goat hair moves and transfers single crystal nanowires under an optical microscope. On an in-situ nanomechanical test system of a TEM, local single crystal nanowires are irradiated with an electron beam for conducting amorphization transformation. Amorphous length of a single crystal after transformation is 60-100 nm. A fracture strength test is conducted on the amorphous nanowires in the single crystal after transformation in the TEM; and fracture strength of the amorphous nanowires is 9-11 GPa. After the amorphous nanowires are fractured, unloading causes a slight contact between the fractured end surfaces; and self-healing of the nanowires is conducted after waiting for 16-25 min in a vacuum chamber of the TEM. Atom diffusion is found at a healed fracture through in-situ TEM representation; and recrystallization is found in the amorphous nanowires. The present invention provides a method for realizing self-healing for fractured SiC amorphous nanowires without external intervention.


Find Patent Forward Citations

Loading…