The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Feb. 27, 2018
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Shogo Kubota, Kobe, JP;
Seiya Shinabe, Kobe, JP;
Hiroyuki Koga, Kobe, JP;
Noriyuki Nakanishi, Kobe, JP;
Yuichiro Ohmae, Kobe, JP;
Toshihisa Tanaka, Kobe, JP;
Tetsuya Oda, Kobe, JP;
SYSMEX CORPORATION, Hyogo, JP;
Abstract
Disclosed is a specimen smearing apparatus including: a slide supplying section configured to supply a glass slide yet to be processed; a first processing section configured to perform a first process on the glass slide, the first processing section being disposed in a first direction with respect to the slide supplying section, the first direction being a far direction of an apparatus body of the specimen smearing apparatus; a second processing section configured to perform on the glass slide a second process which is different from the first process, the second processing section being disposed in a second direction with respect to the first processing section, the second direction being a left-right direction of the apparatus body and orthogonal to the first direction; and a first drying processing section disposed in a third direction with respect to the second processing section, the third direction being a near direction of the apparatus body and opposite to the first direction, the first drying processing section configured to dry a specimen on the glass slide on which the first process and the second process have been performed, wherein one of the first processing section and the second processing section is configured to perform a smearing process for smearing a specimen on the glass slide.