The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Aug. 23, 2018
Industrial Technology Research Institute, Hsinchu, TW;
Yao-Long Tsai, Kaohsiung, TW;
Li-Hua Wang, Hsinchu, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
A method for detecting a deterioration defect of a structural part using a structural unit includes: defining a first base structural unit and obtaining N first base modal parameters of the first base structural unit; detecting a respective one of M first subject structural units of a subject structural part by each of M first sensors to obtain N first actual modal parameters of each of the M first subject structural units; calculating N first subject modal parameters of each of the M first subject structural units according to the N first actual modal parameters of each of the M first subject structural units and M*N first predetermined ratios; and comparing the N first subject modal parameters of each of the M first subject structural units to the N first base modal parameters to determine whether each of the M first subject structural units has a deterioration defect.
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