The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Sep. 28, 2018
General Electric Company, Schenectady, NY (US);
Srikrishnan Viswanathan, Bangalor, IN;
Arun Kumar Chandrashekarappa, Bangalor, IN;
Nasir Ahmed Desai, Bangalor, IN;
Xin Li, Beijing, CN;
Bin Ye, Beijing, CN;
Qingyong Ding, Beijing, CN;
Youyou Chen, Beijing, CN;
General Electric Company, Schenectady, NY (US);
Abstract
A method of calibrating a system for imaging a subject is provided. The method includes determining a position of an X-ray source of the system operative to transmit X-rays through the subject; and calibrating the position of the X-ray source with respect to a detector of the system, based at least in part on a field of view of the X-ray source, the detector operative to receive the X-rays transmitted by the X-ray source. In embodiments, the method includes positioning an X-ray source of the system via a controller at one or more calibration positions based at least in part on at least one camera of the system. In such embodiments the X-ray source is disposed on a mobile arm and operative to transmit X-rays through the subject, and a field of view of the X-ray source is directed substantially towards the detector at each of the calibration positions.