The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Nov. 06, 2018
Applicant:

Canon Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Kevin Christopher Zimmerman, Sturtevant, WI (US);

Liang Cai, Vernon Hills, IL (US);

Hiroaki Miyazaki, Otawara, JP;

Xiaohui Zhan, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G06T 11/00 (2006.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); G06T 7/62 (2017.01); G06T 11/008 (2013.01);
Abstract

A method and apparatuses are provided to identify and correct partial volume errors (PVEs) in material decomposition of a spectral computed tomography (CT) scan, due to different X-ray trajectories incident on a same macro-pixel passing through different material components (e.g., bone and water). Macro-pixels are virtual crystals generated by aggregating the signals/counts from several smaller actual pixels (i.e., micro-pixels) of a detector array. Thus, when a PVE is identified within a macro-pixel, the separate signals/counts from the micro-pixels can be used for material decomposition, instead of the aggregated signals/counts of the macro-pixel, thereby providing improved spatial resolution of the material components and, at least partial, overcoming the PVE. A measure of the difference between spectrally-resolved counts based a material projection lengths (e.g., from a calibrated lookup table) and the measured counts of the macro-pixel can be used to identify PVEs, e.g., when the difference measure exceeds a predefined threshold.


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