The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Mar. 06, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Dan Morgan, McKinney, TX (US);

Jeffrey Matthew Kempf, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3123 (2013.01); H04N 9/3111 (2013.01); H04N 9/3155 (2013.01); H04N 9/3164 (2013.01); H04N 9/3179 (2013.01);
Abstract

In described examples, a method includes: receiving an array of image data pixels for display by a spatial light modulator; dividing the array of image data pixels into a plurality of blocks. For the blocks of the plurality of blocks, the method includes: computing a mean value for pixels in the block; computing a variance for pixels in the block; and, in response to the mean value and the variance, retrieving an indicator of a likelihood of a visible artifact for the block; and in response to the retrieved indicator, outputting a signal to selectively increase or reduce a load time of the spatial light modulator for displaying the array of image data pixels.


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