The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Nov. 18, 2019
Shanghai Jiao Tong University, Shanghai, CN;
Shanghai Jiao Tong University, Shanghai, CN;
Abstract
Microwave photonic vector network analyzer and a method for measuring scattering parameters of a microwave device are provided. The analyzer comprises a microwave source, wherein a signal loading module, an optical sampling module and a signal processing module are sequentially arranged along a signal output direction of the microwave source; an output end of the signal processing module is respectively connected with a control end of the microwave source and a control end of the optical sampling module; and two test ports of the signal loading module are connected with both ends of a device to be tested. The invention realizes direct sampling and frequency conversion for microwave signals, abandons a superheterodyne structure and/or direct frequency conversion structure in the traditional network analyzer, simplifies the structure of the system while improving the measurement frequency range and avoiding image interference, and reduces system complexity, cost and power consumption.