The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
May. 10, 2016
Csmc Technologies Fab2 Co., Ltd., Wuxi New District, Jiangsu, CN;
CSMC TECHNOLOGIES FAB2 CO., LTD., Wuxi New District, Jiangsu, CN;
Abstract
A delay locked loop detection system (), the system can be used for detecting the working state of a delay locked loop () and comprises: a signal generator (), which is used for generating a reference clock and providing the reference clock to the delay locked loop (); and a testing instrument (), which is used for acquiring the clock signals output from the delay locked loop () and measuring whether the time delays thereof are consistent with expectations; the detection system () further comprises at least one of the following circuits: a pre-receiving circuit (), which is used for receiving the reference clock from the signal generator () and amplifying and shaping the reference clock and then providing the reference clock to the delay locked loop (); and a multiphase multiplexing circuit (), which is used for receiving the clock signals output from the delay locked loop () and synthesizing and then providing a plurality of clock signals with different delay to the testing instrument (). Also included is a delay locked loop detection method. The system and method mentioned above enable an accurate measurement for the delays of the delay locked loop.