The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jan. 03, 2018
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Zygmunt Zubkow, Dunedin, FL (US);

Richard Wessels, Dunedin, FL (US);

John Lintz, Glendale, AZ (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); H03K 19/003 (2006.01); G01T 1/02 (2006.01); H01L 31/119 (2006.01);
U.S. Cl.
CPC ...
H03K 19/0033 (2013.01); G01T 1/026 (2013.01); G06F 11/14 (2013.01); H03K 19/00338 (2013.01); H01L 31/119 (2013.01);
Abstract

Techniques to compensate non-radiation hardened components for changes or degradation in performance that result from exposure to radiation. During testing and modeling phase, a component's performance may be characterized as a result of the exposure to radiation. In some examples, some performance characteristics, such as voltage response, frequency response, gain, leakage or other characteristics, may change as the component's exposure to an amount of radiation increases. During normal operation, a system may include one or more devices that measure the amount of radiation to which the system may be subjected, such as a radiation dosimeter. The system may compensate the non-radiation hardened component based on the amount of radiation received the known component performance change caused by radiation as determined during the modeling phase.


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