The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Oct. 31, 2018
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Hisaaki Watanabe, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02P 6/16 (2016.01); G01D 3/08 (2006.01); G01D 5/244 (2006.01); G01D 5/14 (2006.01); G01M 1/22 (2006.01);
U.S. Cl.
CPC ...
H02P 6/16 (2013.01); G01D 3/08 (2013.01); G01D 5/14 (2013.01); G01D 5/24466 (2013.01); G01M 1/22 (2013.01);
Abstract

The conventional semiconductor device requires use of a separate vibration sensor or the like to detect a rotation abnormality of a motor. According to an embodiment, a semiconductor device includes: a resolver rotation angle conversion circuit that obtains a rotation angle signal indicative of a rotation angle of the motor obtained from a resolver that measures the rotation angle of the motor and generates rotation angle information by converting the rotation angle signal to a digital value; a motor rotation angle conversion circuit that generates rotation angle temporal change information by converting the rotation angle information with respect to each phase of the motor to an angular change of the motor; and a determination circuit that determines that an abnormality occurs in the motor in a case of exceeding a fluctuation abnormality detection range of the rotation angle temporal change in the rotation angle temporal change information.


Find Patent Forward Citations

Watanabe, Hisaaki. (2020). Semiconductor device and method of detecting its rotation abnormality (U.S. Patent No. 10797623). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10797623

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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