The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Jul. 20, 2018
Qc Ware Corp., Moffett Field, CA (US);
Randall R. Correll, Mountain View, CA (US);
Asier Ozaeta Rodriguez, Merced, CA (US);
Alejandro Perdomo Ortiz, Berkeley, CA (US);
QC Ware Corp., Palo Alto, CA (US);
Abstract
Fault tree analysis is performed using a combination of digital computer systems and quantum processing devices. For example, quantum annealers may be configured to analyze a fault tree for minimal cut sets. The quantum annealer may be particular good at identifying smaller minimal cut sets. Digital computer systems may be used to identify the remaining minimal cut sets. If the quantum annealer identifies one of the minimal cut sets of smallest size (i.e., lowest cardinality), this can be used as a constraint for the digital computer system, thus speeding up its search for other minimal cut sets.