The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Dec. 27, 2017
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Min Zhang, San Ramon, CA (US);
Gopal Biligeri Avinash, San Ramon, CA (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G16H 30/40 (2018.01); G06N 20/20 (2019.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06N 3/0454 (2013.01); G06K 9/6267 (2013.01); G06N 3/08 (2013.01); G06N 20/20 (2019.01); G06T 7/0012 (2013.01); G16H 30/40 (2018.01); G06K 2209/05 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
Systems and techniques for facilitating a deep learning architecture for automated image feature extraction are presented. In one example, a system includes a machine learning component. The machine learning component generates learned imaging output regarding imaging data based on a convolutional neural network that receives the imaging data. The machine learning component also performs a plurality of sequential and/or parallel downsampling and upsampling of the imaging data associated with convolutional layers of the convolutional neural network.