The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Nov. 29, 2018
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Yong-Ju Kim, Seoul, KR;

Do-Sun Hong, Gyeonggi-do, KR;

Dong-Gun Kim, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/52 (2006.01); G06F 11/10 (2006.01); G11C 29/44 (2006.01); G11C 29/42 (2006.01); H03M 13/15 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/1004 (2013.01); G06F 11/1048 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01); G11C 2029/0411 (2013.01); G11C 2029/4402 (2013.01); H03M 13/1515 (2013.01);
Abstract

A memory system includes a plurality of memory chips suitable for storing data and an error correction code thereof, an error correction circuit suitable for detecting and correcting error bits of data, which are read from the plurality of memory chips, based on an error correction code of the read data, an address storage circuit suitable for storing addresses of first data, among the read data, the first data having a number of detected error bits greater than or equal to a first number, and a failed chip detection circuit suitable for, when the number of the stored addresses is greater than or equal to a second number, detecting a failed memory chip where a chip-kill occurs by writing test data in the plurality of memory chips and reading back the written test data.


Find Patent Forward Citations

Loading…