The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Dec. 03, 2018
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Jianwu Xu, Titusville, NJ (US);

Hui Zhang, Princeton Junction, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Tanay Kumar Saha, Indianapolis, IN (US);

Pranay Anchuri, Princeton Junction, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06K 9/62 (2006.01); G06F 11/14 (2006.01); G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0793 (2013.01); G06F 11/1471 (2013.01); G06K 9/6218 (2013.01); G06K 9/6885 (2013.01);
Abstract

Methods and systems for system failure diagnosis and correction include extracting syntactic patterns from a plurality of logs with heterogeneous formats. The syntactic patterns are clustered according to categories of system failure. A single semantically unique pattern is extracted for each category of system failure. The semantically unique patterns are matched to recent log information to detect a corresponding system failure. A corrective action us performed responsive to the detected system failure.


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