The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Jun. 27, 2017
Palantir Technologies Inc., Palo Alto, CA (US);
Trevor Fountain, Nacogdoches, TX (US);
Jiawei Marvin Sum, New York, NY (US);
Rebecca Egger, San Francisco, CA (US);
Siddharth Rajgarhia, London, GB;
Thomas Alexander, Abu Dhabi, AE;
Tyler Uhlenkamp, Central City, IA (US);
Palantir Technologies Inc., Palo Alto, CA (US);
Abstract
Systems, methods, and non-transitory computer readable media are provided for presenting a user interface for fault analysis. Fault information may be accessed. The fault information may identify faults for one or more machines. A fault analysis interface may be provided. The fault analysis interface may include an organization view, an instance view, a subsystem view, or a map view. The fault analysis interface may enable presentation of the organization view, the instance view, the subsystem view, and the map view. The fault analysis interface may display correlations of the faults using visuals and spatial locations of the visuals.