The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Apr. 25, 2018
Applicant:
Topcon Corporation, Itabashi-Ku, Tokyo, JP;
Inventors:
Nobuyuki Nishita, Tokyo, JP;
Mitsuru Ogawa, Tokyo, JP;
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G05D 1/00 (2006.01); G01C 11/02 (2006.01); G01C 15/06 (2006.01); G01C 11/06 (2006.01); G05D 1/10 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G05D 1/0094 (2013.01); G01C 11/02 (2013.01); G01C 11/06 (2013.01); G01C 15/06 (2013.01); G05D 1/101 (2013.01); G01C 15/002 (2013.01);
Abstract
A photogrammetry analysis unit of an analysis device associates the survey result obtained by a surveying device with a photographing position of each image taken by a camera, recognizes the surveying device from the image containing the surveying device, corrects the photographing position based on the known point coordinates of the surveying device, and generates the data for photogrammetry.