The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Jan. 22, 2018
Infineon Technologies Ag, Neubiberg, DE;
Avik Santra, Munich, DE;
Ashutosh Baheti, Munich, DE;
Thomas Finke, Gilching, DE;
Reinhard-Wolfgang Jungmaier, Aying, DE;
Saverio Trotta, Munich, DE;
Raghavendran Vagarappan Ulaganathan, Munich, DE;
INFINEON TECHNOLOGIES AG, Neubiberg, DE;
Abstract
An embodiment method includes identifying a set of targets within a field of view of a millimeter-wave radar sensor based on radar data received by the millimeter-wave radar sensor; capturing radar data corresponding to the set of targets across a macro-Doppler frame; performing macro-Doppler processing on the macro-Doppler frame and determining whether a macro-Doppler signal is present in the macro-Doppler frame based on the macro-Doppler processing; capturing radar data corresponding to the set of targets across a micro-Doppler frame, wherein the micro-Doppler frame has a duration equal to a first plurality of macro-Doppler frames; performing micro-Doppler processing on the micro-Doppler frame and determining whether a micro-Doppler signal is present in the micro-Doppler frame based on the micro-Doppler processing; and activating at least one range bin of a plurality of range bins in response to a determination that at least one of the macro-Doppler signal or the micro-Doppler signal is present.