The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Mar. 09, 2017
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Kyoto University, Kyoto, JP;

Inventors:

Hidefumi Takamine, Tokyo, JP;

Kazuo Watabe, Kanagawa, JP;

Tomoki Shiotani, Kyoto, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/06 (2006.01); G01N 17/00 (2006.01); G01N 33/38 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 7/06 (2013.01); G01N 17/00 (2013.01); G01N 33/383 (2013.01); G01S 13/88 (2013.01);
Abstract

A structure evaluation apparatus has an acquisitor and an evaluator. The acquisitor acquires a distribution that represents a distribution of strength of a reflected wave obtained by an electromagnetic radar scan to a reinforced concrete which comprises concrete and a material other than concrete. The evaluator calculates similarity, with reference to a reference region including the material in the distribution, of other regions including the material than the reference region in the distribution.


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