The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jan. 15, 2020
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Prasanna U. Rajagopal, Dallas, TX (US);

Kallikuppa M Sreenivasa, Bangalore, IN;

Amit G Kumbasi, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/59 (2020.01); G01R 19/25 (2006.01); G01R 31/50 (2020.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/59 (2020.01); G01R 19/2513 (2013.01); G01R 31/2612 (2013.01); G01R 31/50 (2020.01);
Abstract

In described examples, a time-domain analyzer is arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that includes a fundamental periodic frequency. The high-frequency events include frequencies higher than the fundamental periodic frequency. A frequency-domain analyzer is arranged to generate frequency band information in response to frequencies of the electrical monitor signal that are higher than the fundamental periodic frequency. A fault detector is arranged to monitor the indication of the number of high-frequency events and the generated frequency band information, and to generate a fault flag in response to the monitored indication of the number of high-frequency events and the generated frequency band information.


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