The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Oct. 16, 2018
Optimal Plus Ltd., Holon, IL;
OPTIMAL PLUS LTD, Holon, IL;
Abstract
A method of testing a tester, comprising testing electronic units using a plurality of sites in order to obtain first bin assignment, instructing the tester to perform a tester quality test if conditions Cand Care met, the tester quality test comprising performing a second plurality of tests on an electronic unit using a first site, thereby obtaining second bin assignment for the electronic unit, the second bin assignment being representative of passing or failing of the electronic unit of the second plurality of tests with respect to at least one second test criteria, wherein Cis met if passing first bin assignment has been obtained for said electronic unit connected to the tester using the first site, and wherein Cis met if data representative of passing first bin assignment obtained for electronic units which have been tested on the first site, meets a quality criteria.