The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Dec. 21, 2018
Virgilio Go Boncan, Houston, TX (US);
Kevin C. Madsen, Houston, TX (US);
Richard F. Lukay, Houston, TX (US);
Virgilio Go Boncan, Houston, TX (US);
Kevin C. Madsen, Houston, TX (US);
Richard F. Lukay, Houston, TX (US);
OFI Testing Equipment, Inc., Houston, TX (US);
Abstract
Embodiments of a sample testing system of the present invention generally include two internally threaded caps; an externally threaded outer tube having a tapered internal bore and external circumferential grooves proximate each end thereof; an O-ring seated in each groove; and a plurality of inner tube sections cooperatively arranged to form an externally tapered inner tube structure that is disposed within the outer tube; wherein each cap is sealingly attached to an end of the outer tube via threading engagement therewith. Various embodiments utilize at least one closed-ended cap and/or at least one cap having a port extending through an end thereof, which may also incorporate a piston cavity and a piston having two circumferentially disposed O-rings. Embodiments allow for inner tube structure removal and separation of the inner tube sections for cured sample recovery. Embodiments of a method of using the system to cure a sample are also provided.