The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jun. 29, 2017
Applicant:

Flir Detection, Inc., Stillwater, OK (US);

Inventors:

Robert K. Shelton, Stillwater, OK (US);

Brian D. O'Dell, Stillwater, OK (US);

Shiou-Jyh Ja, Stillwater, OK (US);

Assignee:

FLIR DETECTION, INC., Stillwater, OK (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01N 33/22 (2006.01); G01N 21/35 (2014.01); G01N 21/3504 (2014.01); G01N 21/3563 (2014.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/22 (2013.01); G01N 21/35 (2013.01); G01N 21/3504 (2013.01); G01N 21/3563 (2013.01); G01N 33/0057 (2013.01); G01N 2201/0221 (2013.01);
Abstract

Imaging techniques are provided to determine the presence of trace chemicals corresponding to various materials of interest. In one example, a method includes receiving a test sample and capturing a plurality of infrared images of the test sample. Each infrared image corresponds to a different range of infrared radiation wavelengths. The method also includes determining a spectral profile of the test sample using the infrared images, comparing the determined spectral profile to a known spectral profile of a material of interest, and determining whether the material is present in the test sample based on the comparing. Additional methods and related devices are also provided.


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