The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jan. 30, 2018
Applicant:

Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno, s-Gravenhage, NL;

Inventors:

Peter Johan Harmsma, Vleuten, NL;

Bart Michiel de Boer, Rotterdam, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/45 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 2021/458 (2013.01);
Abstract

A method and system for measuring a sample property (X) by means of photonic circuit (). The photonic circuit () comprises at least two photonic sensors () configured to modulate the light according to respective output signals (S,S) with periodically recurring signal values (V, V). The photonic sensors () comprise a low range sensor () with a relatively low range or high sensitivity for measuring a change (ΔX) of the sample property (X) and a high range sensor () with a relatively high range or low sensitivity to measure the change (ΔX) of the sample property (X). The sample property (X) is calculated by combining the output signals (S, S) of the sensors (). Particularly, the second output signal (S) of the high range sensor () is used to distinguish between recurring signal values (V) in the first output signal (S) of the low range sensor ().


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