The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Sep. 14, 2018
United Technologies Corporation, Farmington, CT (US);
Eli Cole Warren, Wethersfield, CT (US);
Michael F. Sabol, Port St. Lucie, FL (US);
Alan E. Ingram, Palm City, FL (US);
Michael J. Saitta, East Hampton, CT (US);
Darren M. Wind, Glastonbury, CT (US);
Steven D Mitchell, Port St. Lucie, FL (US);
Sebastian Martinez, Ivoryton, CT (US);
Kevin Andrew Ford, Killingworth, CT (US);
Patrick M. Harrington, West Hartford, CT (US);
Raytheon Technologies Corporation, Farmington, CT (US);
Abstract
A low profile un-lensed non-intrusive stress measurement system probe may comprise a housing comprising a first channel and an optical face, a first hypotube disposed within the first channel and coupled at a sensing aperture in the optical face, and a plurality of optical fibers disposed within the first hypotube, wherein the first hypotube executes a bend between 45° and 90° within the housing.