The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Jan. 16, 2019
Omron Corporation, Kyoto, JP;
Hiroyuki Hazeyama, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An appearance inspection device that can easily determine optimum values of various imaging parameters is provided. An appearance inspection device includes: a moving means which changes relative positions of at least two or more portions within a work-piece, an imaging part, and an illumination part; an imaging processing part which performs, in a state that the illumination part irradiates a light to the work-piece, a processing for changing imaging parameters and taking a plurality of images by the imaging part under a condition that plural types of imaging parameters with mutually different properties are variably set, the plural types of imaging parameters including a change of the relative position between the work-piece and the imaging part caused by the moving means; and a parameter determining part determining a set of optimum values of the plural types of imaging parameters that are set variably based on the plurality of taken images.