The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jan. 19, 2017
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Raimon Castells de Monet, Sant Cugat del Valles, ES;

David Faundez Barroso, Sant Cugat del Valles, ES;

David Munoz Navarro, Sant Cugat del Valles, ES;

Marco Ignacio Barbetta, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 25/308 (2006.01); G01B 5/06 (2006.01); B41J 11/00 (2006.01);
U.S. Cl.
CPC ...
B41J 25/308 (2013.01); B41J 11/0095 (2013.01); G01B 5/06 (2013.01);
Abstract

Measuring the thickness of a print media supported by a platen or belt by: moving a measurement bar to a first position to contact a surface of the platen or belt, moving the measurement bar to a second position to contact a surface of the print media when supported by the platen or belt, and determining the spatial difference between the first and second positions such as to measure the thickness of the print media. The measurement bar is arranged to cover a width of the print media when supported by the platen or belt.


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