The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2020
Filed:
Dec. 20, 2016
Device and method for calibrating a device for generatively manufacturing a three-dimensional object
Eos Gmbh Electro Optical Systems, Krailling, DE;
Jochen Philippi, Gräfelfing, DE;
EOS GmbH Electro Optical Systems, Krailling, DE;
Abstract
A calibration ledge serves for calibrating a manufacturing device for manufacturing a three-dimensional object by a layer-by-layer solidification of a building material at the points corresponding to the respective cross-section of the object by selectively irradiating layers of the building material with a radiation in a working plane. The calibration ledge has an elongated shape and includes an aperture ledge extending in its longitudinal direction and comprising several aperture openings arranged in a row in the longitudinal direction of the calibration ledge which are more permeable for the radiation of the irradiation device than the region of the aperture ledge surrounding the aperture openings.