The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Jan. 13, 2017
Applicant:

Topcon Corporation, Itabashi-ku, JP;

Inventors:

Takefumi Hayashi, Wako, JP;

Kouta Fujii, Toda, JP;

Assignee:

TOPCON CORPORATION, Itabashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/103 (2006.01); A61B 3/107 (2006.01); A61B 3/12 (2006.01); A61B 3/00 (2006.01); A61B 3/14 (2006.01); A61B 3/16 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/103 (2013.01); A61B 3/1005 (2013.01); A61B 3/107 (2013.01); A61B 3/1035 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01); A61B 3/16 (2013.01);
Abstract

An ophthalmological device according to the embodiments comprises an objective lens, a subjective inspection optical system, and an interference optical system. The subjective inspection optical system includes an optical element capable of correcting aberration of a subject's eye and projects a visual target onto the subject's eye via the objective lens and the optical element. The interference optical system splits light from a light source into reference light and measurement light, projects the measurement light onto the subject's eye via the objective lens and the optical element, generates interference light between returning light of the measurement light and the reference light, and detects the generated interference light.


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