The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Dec. 19, 2017
Threat Stack, Inc., Boston, MA (US);
Christopher Gervais, Westwood, MA (US);
Sean T. Reed, Seattle, WA (US);
Nicholas S. Goodwin, Everett, MA (US);
Joseph D. Baker, Burlington, MA (US);
Samuel Bisbee-vonKaufmann, Braintree, MA (US);
Nathan D. Cooprider, Bedford, MA (US);
David G. Hagman, Tewksbury, MA (US);
Lucas M. Dubois, Dorchester, MA (US);
Jennifer A. Andre, Somerville, MA (US);
Threat Stack, Inc., Boston, MA (US);
Abstract
A cloud-based operating-system-event and data-access monitoring method includes collecting event information from a monitored cloud-based element. One or more structured event payloads based on the event information is then generated. The structured event payloads that produce one or more validated event collections are then validated. The one or more validated event collections are then serialized and filtered to remove redundant structured event payload data. The filtered validated structured event payloads are then de-serialized to produce a time-sequenced, ordered event stream. The time-sequenced, ordered event stream is de-duplicated to remove duplicate structured event payloads. The time-sequenced ordered event stream is then processed to generate processed information security results.