The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Jun. 21, 2018
Applicant:

Lear Corporation, Southfield, MI (US);

Inventors:

Antoni Ferre Fabregas, Valls, ES;

David Gamez Alari, Valls, ES;

Federico Giordano, Valls, ES;

Jignesh Chauhan, Pune, IN;

Om Prakash, Pune, IN;

Abhishek Sharma, Bakani, IN;

Assignee:

Lear Corporation, Southfield, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/12 (2006.01); G01R 35/00 (2006.01); G01R 31/382 (2019.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); G01R 31/382 (2019.01); G01R 35/007 (2013.01); H03M 1/1205 (2013.01); H03M 1/126 (2013.01);
Abstract

A method and system to perform the verification of measures done by a sensor in quasi real-time. The sensor verification may be implemented at two different levels—a functionality level and a measurement level. At the functionality level, a consistency check of information from different variables may be processed at sensor level depending on the functionality of the physical system being measured. At the measurement level, diagnostics may be performed of the circuits present in the measurement path by specific circuitry and at suitable instants of time to guarantee a Fault Tolerant Time Interval while minimizing sample loss. This may be achieved, at least in part, by increasing the measuring sample rate.


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