The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Sep. 15, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hien P Dang, Nanuet, NY (US);

Sri M Sri-Jayantha, Ossining, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/538 (2006.01); H01L 27/02 (2006.01); H01L 23/532 (2006.01); H01L 23/00 (2006.01); G06F 30/17 (2020.01); G06F 30/327 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
H01L 23/5383 (2013.01); G06F 30/17 (2020.01); G06F 30/327 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); H01L 23/53228 (2013.01); H01L 23/562 (2013.01); H01L 27/0207 (2013.01);
Abstract

This invention is a laminated structure and methods used for electrically connecting one or more semiconductor chips to various external electrical connections where stresses within the laminated structure due to thermal cycle are reduced by adding conductive material to selected subareas of upper and lower layers in the structure such that the volume of conductive material in corresponding subareas is equal in amount and orientation within a threshold. This reduces differential stresses between the layers as temperature changes and accordingly reduces failures of materials and/or connections in the structure during manufacturing and operation.


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