The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Nov. 01, 2017
Applicant:
Anritsu Infivis Co., Ltd., Kanagawa-ken, JP;
Inventors:
Koji Omori, Kanagawa-ken, JP;
Daiki Kataoka, Kanagawa-ken, JP;
Assignee:
ANRITSU INFIVIS CO., LTD., Kanagawa-Ken, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21F 3/00 (2006.01); G01N 23/083 (2018.01); G01N 23/18 (2018.01);
U.S. Cl.
CPC ...
G21F 3/00 (2013.01); G01N 23/083 (2013.01); G01N 23/18 (2013.01); G01N 2223/645 (2013.01);
Abstract
An X-ray inspection device performs inspection by irradiating an X-ray on an inspection object conveyed in an X-ray shielded space. The device has a shielding gate, having a passage part the shape of which is changeable in correspondence with the outer shape of the inspection object, so as to pass the inspection object. The shielding gate may be retractably provided in a shielding position inside the shielded space.