The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Dec. 11, 2018
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventors:

Soo Young Jang, Seoul, KR;

Kyu Bong Kong, Hwaseong-si, KR;

Geun Il Lee, Yongin-si, KR;

Yong Suk Joo, Yongin-si, KR;

Kyung Ho Chu, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/10 (2006.01); G11C 29/52 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G11C 7/1006 (2013.01); G11C 29/52 (2013.01);
Abstract

A semiconductor apparatus includes: a pad unit comprising a plurality of data input/output (I/O) pads and a plurality of error detection code pads; an error detection code (EDC) read path configured to generate a plurality of EDCs by performing an error detection operation on a plurality of data, and output the plurality of EDCs through the plurality of error detection code pads; a comparison circuit configured to generate a comparison result signal by comparing the plurality of EDCs; and a data read path configured to output the comparison result signal through any one of the plurality of data I/O pads.


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