The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Nov. 19, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Alexander John Naylor, Newbury, GB;

Samuel Smith, Eastleigh, GB;

Oliver Masters, Birmingham, GB;

Aaron Tomor Robert Gashi, Eastleigh, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 9/00 (2020.01); E05B 35/00 (2006.01);
U.S. Cl.
CPC ...
G07C 9/00309 (2013.01); E05B 35/001 (2013.01);
Abstract

A method, computer system, and computer program product for using strain gauges to detect a state of a lock. The strain gauges may be disposed within a key or a key head sub-system. The key bank system may include receiving a first signal, comparing the first signal with first or second signatures, and determining state change of a lock when the first signal matches the first or second signal within a first or second threshold. The key bank system may include receiving a current state of the lock, where the state of the lock is the first state, and changing the current state of the lock to a second state, where the second state is opposite the first state. The current state of the lock may be displayed on a communication device and may be stored in a memory of a communication device or a memory of a server.


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