The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Jun. 25, 2018
Applicant:

Henkel Ip & Holding Gmbh, Duesseldorf, DE;

Inventors:

Joseph D. Dahlmeyer, Jr., East Haven, CT (US);

Wendy A. Saladyga, New Fairfield, CT (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/00 (2006.01); G06T 7/40 (2017.01); D06F 34/18 (2020.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); D06F 34/18 (2020.02); G06T 5/007 (2013.01); G06T 7/40 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30124 (2013.01);
Abstract

Systems and methods for analyzing a fabric article to determine fiber damage are provided herein. In an embodiment of a method for analyzing a fabric article, the fabric article is provided and at least one image of the fabric article is captured using a three-dimensional imaging device. The at least one image is processed using a contrast function to produce a processed data set that is representative of fiber damage in a viewing area of the three-dimensional imaging device. Optionally, a processed image is produced based upon the processed data set.


Find Patent Forward Citations

Dahlmeyer, Jr., Joseph. (2020). Systems and methods for analyzing a fabric article (U.S. Patent No. 10789702). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10789702

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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