The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
May. 24, 2018
Tfi Digital Media Limited, Hong Kong, HK;
Lai Man Po, Hong Kong, HK;
Mengyang Liu, Hong Kong, HK;
Yiu Fai Yuen, Hong Kong, HK;
Yuming Li, Beijing, CN;
Xuyuan Xu, Shenzhen, CN;
Chang Zhou, Hong Kong, HK;
Hon Wah Wong, Hong Kong, HK;
Kin Wai Lau, Hong Kong, HK;
Hon Tung Luk, Hong Kong, HK;
Hok Kwan Cheung, Hong Kong, HK;
TFI DIGITAL MEDIA LIMITED, Hong Kong, HK;
Abstract
The present disclosure relates to a method for image patch selection for training a neural network for image quality assessment. The method includes receiving an input image and extracting one or more image patches from the input image. The moment of the extracted image patches is measured. There is a decision to accept or decline the extracted image patches according to the measured moment. Additional image patches are extracted until a minimum number, N, of extracted image patches are accepted. Alternatively, selection criteria are adjusted until the minimum number of extracted image patches are accepted. The selected image patches are input into a neural network with a corresponding image quality value of the input image, and the neural network is trained with the image patches and image quality value. Also provided is a method for image quality assessment using a neural network trained as set forth above.