The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

May. 11, 2018
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Diptarka Saha, Malda, IN;

Debanjana Banerjee, Kolkata, IN;

Bodhisattwa Prasad Majumder, Kolkata, IN;

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/62 (2006.01); G06F 11/07 (2006.01); G06F 16/9038 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06F 11/0766 (2013.01); G06F 16/9038 (2019.01); G06K 9/623 (2013.01); G06K 9/6218 (2013.01);
Abstract

Examples provide a system for detecting anomalies in a dataset. The system includes one or more processors and a memory storing the dataset. The one or more processors are programmed to identify a first set of data points in a cluster, identify a second set of data points outside of the cluster as noisy data points, and determine whether each of the noisy data points is an anomaly by: determining a distance between the noisy data point and other data points in the dataset, ranking the distances between the noisy data point and the other data points, and applying a weight to each of the ranked distances to determine an outlier value for the noisy data point. When the outlier value for the noisy data point exceeds a threshold, the noisy data point is identified as an anomaly, and result is displayed in a user interface.


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