The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Feb. 13, 2018
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Dimitar Vlassarev, Broomfield, CO (US);

Andrei Khurshudov, Niwot, CO (US);

Assignee:

SEAGATE TECHNOLOGY LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0727 (2013.01); G06F 11/008 (2013.01); G06F 11/0766 (2013.01); G06F 11/2094 (2013.01);
Abstract

Methods, apparatuses, systems, and devices are described for improving data durability in a data storage system. In one example method of improving data durability, a hardware failure risk indicator may be determined for each of a plurality of data storage elements in the data storage system. The method may also include storing one or more replicas of a first data object on one or more of the plurality of data storage elements, with a quantity of the one or more replicas and a distribution of the one or more replicas among the plurality of data storage elements being a function of the hardware failure risk indicators for each of the plurality of data storage elements. In some examples, the hardware failure risk indicators may be dynamically updated based on monitored conditions, which may result in dynamic adjustments to the quantity and distribution of the data object replicas.


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