The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Feb. 09, 2017
Japan Science and Technology Agency, Saitama, JP;
Hideharu Mikami, Tokyo, JP;
Keisuke Goda, Tokyo, JP;
Japan Science and Technology Agency, Saitama, JP;
Abstract
Provided are an irradiation device, a laser microscope system, an irradiation method, and a laser microscope detection method which can further widen a bandwidth of detection light as a multiplexed signal. Laser light beams are separated and enter a first AOD () and a second AOD () so that a plurality of first diffracted light beams and a plurality of second diffracted light beams with deflection angles and sizes of frequency shifts different from each other are generated. The first diffracted light beams and the second diffracted light beams are superposed by a beam splitter () so as to generate a plurality of interference light beams with beat frequencies different from each other. An objective lens () is formed by aligning a plurality of irradiation spots of interference light beam linearly in a main scanning direction and irradiates a sample (T) with the interference light beam. The irradiation spot is moved by oscillation of a scanning mirror () in a sub scanning direction orthogonal to the main scanning direction. Fluorescence emitted from the sample (T) by irradiation of each interference light beam is detected by a light detection unit ().