The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Oct. 27, 2017
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Riley Beck, Eagle Mountain, UT (US);

Rishi Pratap Singh, Provo, UT (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/50 (2020.01); G01R 31/34 (2020.01); H02H 1/00 (2006.01); H02H 3/16 (2006.01); H02H 7/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/50 (2020.01); G01R 31/34 (2013.01); H02H 1/0007 (2013.01); H02H 3/16 (2013.01); H02H 7/08 (2013.01);
Abstract

Implementations of fault detection circuits may include a first current transformer coupled to a second current transformer, a positive feedback circuit including the first current transformer, the second current transformer, a first switch, and one of a comparator, an amplifier, and an inverter. The circuit may also include a plurality of logic gates that may be coupled with the positive feedback circuit. The positive feedback circuit may be configured to oscillate upon detecting a ground neutral fault and to send a fault signal to the plurality of logic gates. The plurality of logic gates may be configured to analyze the fault signal and open the first switch. The plurality of logic gates may be further configured to identify whether the fault signal represents one of a true fault or a noise fault by analyzing the output of the positive feedback circuit after the first switch has been opened.


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