The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Apr. 25, 2018
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Boe Optoelectronics Technology Co., Ltd., Anhui, CN;
Xun Pu, Beijing, CN;
Hongmin Li, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Anhui, CN;
Abstract
A test device and a test method are provided. The test device can comprise a movable probe platform, a plurality of signal access points, and a plurality of test probes fixed on the movable probe platform. Each of the plurality of signal access points is correspondingly coupled to one test probe for accessing a corresponding test signal. The plurality of the test probes are configured to contact with test pads on a panel to be tested, and to transmit test signals accessed from the plurality of the signal access points to the test pads, so as to perform an electrical test to the panel to be tested.