The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Aug. 23, 2016
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Yutaro Yamamura, Kyoto, JP;

Toshikazu Minohata, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/00 (2006.01); G01N 30/72 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/04 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/7206 (2013.01); G01N 27/62 (2013.01); H01J 49/0027 (2013.01); H01J 49/0036 (2013.01); H01J 49/025 (2013.01); H01J 49/04 (2013.01); G01N 30/8679 (2013.01);
Abstract

A mass spectrometry data processor () having a database () for storing respective pieces of mass spectrum data of various compounds together with names and mass spectrometry conditions of the compounds includes a mass spectrum data receiver () configured to receive input of mass spectrum data associated with a compound name and a mass spectrometry condition, a determination unit () configured to determine whether the mass spectrum data includes a mass peak satisfying a predetermined criterion, and a database registration unit () that registers, on the database, mass spectrum data determined to include the mass peak satisfying the predetermined criterion or mass spectrum data based on the mass spectrum data determined to include the mass peak satisfying the predetermined criterion together with a compound name and a mass spectrometry condition.


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