The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Jun. 29, 2018
The Boeing Company, Chicago, IL (US);
James J. Troy, Issaquah, WA (US);
Daniel J. Wright, Mercer Island, WA (US);
Scott W. Lea, Renton, WA (US);
Gary Ernest Georgeson, Tacoma, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A dual function non-destructive inspection apparatus comprises a frame structure, a thermographic inspection system, a displacement system, and an ultrasonic inspection system. The frame structure has a channel, a first end, and a second end. The channel extends through the frame structure from the first end to the second end. The thermographic inspection system is associated with the first end of the frame structure. The displacement system is connected to the second end of the frame structure. The ultrasonic inspection system is connected to the displacement system such that the displacement system moves the ultrasonic inspection system relative to the channel of the frame structure.