The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Nov. 22, 2016
Jfe Steel Corporation, Tokyo, JP;
Daisuke Mizuno, Tokyo, JP;
Nobuyuki Ishikawa, Tokyo, JP;
Yutaka Matsui, Tokyo, JP;
Kyono Yasuda, Tokyo, JP;
Koji Fujimoto, Tokyo, JP;
Shigeaki Sugimoto, Tokyo, JP;
JFE Steel Corporation, Tokyo, JP;
Abstract
There are proposed a method for measuring hydrogen-induced cracking which can measure hydrogen-induced cracking initiated in an interior of a test specimen during HIC test and a measuring apparatus used in this method. When cracks initiated in an interior of a test specimenimmersed in a test solutioncontaining hydrogen sulfide is measured by an ultrasonic probeplaced in a vessel, the position and size of cracks initiated in the interior of the test specimenare measured with the lapse of time at a state of immersing the test specimenin the test solution by scanning the ultrasonic probeor the test specimen