The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Oct. 29, 2018
Konica Minolta, Inc., Tokyo, JP;
Shoichi Nomura, Machida, JP;
Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;
Abstract
A correction value calculation method includes: forming, on a recording medium, an inspection image in which two or more types of individual inspection images is formed; calculating a first correction value group including first correction values, and a second correction value group including second correction values, wherein, in the calculating, a combination of the first correction value regarding positional deviation of a light beam that affects density of the individual inspection image, of the first correction value group, and the second correction values regarding an influence amount of multiple exposure effect according to an image pattern corresponding to the individual inspection image, of the second correction value group, and the first correction value group and the second correction value group are calculated on the basis of density information regarding each density of the individual inspection image and the combination of the first and second correction values.