The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2020
Filed:
Nov. 05, 2019
Abb Schweiz Ag, Baden, CH;
Martin Kefer, Shanghai, CN;
Jiafan Zhang, Shanghai, CN;
ABB Schweiz AG, Baden, CH;
Abstract
It is therefore an objective to provide an object multi-perspective inspection apparatus and a method therefor. The apparatus includes an image capture device; an inspection site and at least two reflection devices, being arranged for reflecting simultaneously to the image capture device at least two different side views of the object located in the inspection site; wherein: the image capture device has a field of view including the at least two different side views of the reflection. By introducing reflection devices into the inspection apparatus to enable the image capture device to 'see' the part from multiple views at once, multiple surfaces can be inspected at once, in one image frame, without having the need to reposition the reflection device, the camera and/or the object for every single surface. There are more than one reflection devices placed in the camera's field of view to assist the inspection process by exploiting otherwise hidden surfaces of any given solid object. The effort inspecting every single part form multiple sides is reduced. Therefore, the period of the inspection cycle time can be reduced and inspection on the level of multi-surfaces becomes possible increasing overall quality.