The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2020

Filed:

Nov. 19, 2017
Applicant:

Taidoc Technology Corporation, New Taipei, TW;

Inventors:

Chia-Chi Wu, New Taipei, TW;

Tien-Jung Tsai, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/84 (2006.01); G01N 21/25 (2006.01); G01N 21/00 (2006.01); G01N 21/64 (2006.01); G01N 33/52 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 21/00 (2013.01); G01N 21/255 (2013.01); G01N 21/8483 (2013.01); G01N 33/52 (2013.01); G01N 33/53 (2013.01);
Abstract

The present invention related to an electronic assay apparatus and a testing method thereof. The electronic assay apparatus for determining a result of an assay performed using a test strip comprises three light sources, only one detector and a microprocessor. The three light sources respectively illuminate light incident upon three different zones of the test strip. The detector detects light from the three zones alternately and the distances between the only one detector and the three light sources respectively are almost the same. Further, multiple openings corresponding to the three light sources respectively have the same size and/or shape. The microprocessor compares a calculating result value to only one threshold for showing a result.


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